heap: Shorten concurrent marking tests

This is to address flaky timeouts of these tests.

Bug: 986235
Change-Id: I82658d97947ea1314290f9ffbd40b6529b80e04e
Reviewed-on: https://chromium-review.googlesource.com/c/chromium/src/+/2134253Reviewed-by: Anton Bikineev <bikineev@chromium.org>
Commit-Queue: Omer Katz <omerkatz@chromium.org>
Cr-Commit-Position: refs/heads/master@{#756253}

third_party/blink/renderer/platform/heap/concurrent_marking_test.cc

@@ -38,7 +38,7 @@ class CollectionWrapper : public GarbageCollected<CollectionWrapper<T>> {
 
 template <typename C>
 void AddToCollection() {
-  constexpr int kIterations = 100;
+  constexpr int kIterations = 10;
   IncrementalMarkingTestDriver driver(ThreadState::Current());
   Persistent<CollectionWrapper<C>> persistent =
       MakeGarbageCollected<CollectionWrapper<C>>();
@@ -57,7 +57,7 @@ void AddToCollection() {
 
 template <typename C, typename GetLocation>
 void RemoveFromCollectionAtLocation(GetLocation location) {
-  constexpr int kIterations = 100;
+  constexpr int kIterations = 10;
   IncrementalMarkingTestDriver driver(ThreadState::Current());
   Persistent<CollectionWrapper<C>> persistent =
       MakeGarbageCollected<CollectionWrapper<C>>();
@@ -309,7 +309,7 @@ TEST_F(ConcurrentMarkingTest, SwapHashCountedSet) {
 // Additional test for vectors and deques
 template <typename V>
 void PopFromCollection() {
-  constexpr int kIterations = 100;
+  constexpr int kIterations = 10;
   IncrementalMarkingTestDriver driver(ThreadState::Current());
   Persistent<CollectionWrapper<V>> persistent =
       MakeGarbageCollected<CollectionWrapper<V>>();
@@ -379,7 +379,7 @@ TEST_F(ConcurrentMarkingTest, PopFromVector) {
 // HeapVector with inlined buffer
 
 template <typename T>
-class HeapInlinedVectorAdapter : public HeapVectorAdapter<T, 100> {};
+class HeapInlinedVectorAdapter : public HeapVectorAdapter<T, 10> {};
 
 TEST_F(ConcurrentMarkingTest, AddToInlinedVector) {
   AddToCollection<HeapInlinedVectorAdapter<Member<IntegerObject>>>();